发明公开
EP2695928A1 SCINTILLATOR, RADIATION DETECTOR, AND METHOD FOR DETECTING RADIATION
有权
斯德哥尔摩公司(STRAHLUNGSDETEKTOR UND STRAHLUNGSDETEKTIONSVERFAHREN)
- 专利标题: SCINTILLATOR, RADIATION DETECTOR, AND METHOD FOR DETECTING RADIATION
- 专利标题(中): 斯德哥尔摩公司(STRAHLUNGSDETEKTOR UND STRAHLUNGSDETEKTIONSVERFAHREN)
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申请号: EP12768181.5申请日: 2012-04-02
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公开(公告)号: EP2695928A1公开(公告)日: 2014-02-12
- 发明人: FUKUDA, Kentaro , KAWAGUCHI, Noriaki , YOSHIKAWA, Akira , YANAGIDA, Takayuki , YOKOTA, Yui
- 申请人: Tokuyama Corporation , Tohoku University
- 申请人地址: 1-1, Mikage-cho Shunan-shi, Yamaguchi 745-8648 JP
- 专利权人: Tokuyama Corporation,Tohoku University
- 当前专利权人: Tokuyama Corporation,Tohoku University
- 当前专利权人地址: 1-1, Mikage-cho Shunan-shi, Yamaguchi 745-8648 JP
- 代理机构: Duckworth, Timothy John
- 优先权: JP2011082995 20110404; JP2011140294 20110624
- 国际公布: WO2012137738 20121011
- 主分类号: C09K11/64
- IPC分类号: C09K11/64 ; C09K11/00 ; G01T1/20 ; G01T1/202 ; G01T3/06
摘要:
The present invention aims at providing a scintillator for high temperature environments which has satisfactory light emission characteristics under high temperature environments; and a method for measuring radiation under high temperature environments. The scintillator for high temperature environments comprises a colquiriite-type crystal represented by the chemical formula LiM 1 M 2 X 6 (where M 1 is at least one alkaline earth metal element selected from Mg, Ca, Sr and Ba, M 2 is at least one metal element selected from Al, Ga and Sc, and X is at least one halogen element selected from F, Cl, Br and I), for example, typified by LiCaAlF 6 , and the crystal optionally containing a lanthanoid element such as Ce or Eu. The method for measuring radiation under high temperature environments uses the scintillator.
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