发明公开
EP2702391A1 APPARATUS AND METHOD FOR CONTROLLING RADIATION SOURCE VARIABILITY FOR OPTICAL GAS MEASUREMENT SYSTEMS
审中-公开
设备及其控制方法辐射源变异性光学气体测量系统
- 专利标题: APPARATUS AND METHOD FOR CONTROLLING RADIATION SOURCE VARIABILITY FOR OPTICAL GAS MEASUREMENT SYSTEMS
- 专利标题(中): 设备及其控制方法辐射源变异性光学气体测量系统
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申请号: EP12718377.0申请日: 2012-04-04
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公开(公告)号: EP2702391A1公开(公告)日: 2014-03-05
- 发明人: JIANG, Zhi-Xing , PIERRY, Anthony
- 申请人: Koninklijke Philips N.V.
- 申请人地址: High Tech Campus 5 5656 AE Eindhoven NL
- 专利权人: Koninklijke Philips N.V.
- 当前专利权人: Koninklijke Philips N.V.
- 当前专利权人地址: High Tech Campus 5 5656 AE Eindhoven NL
- 代理机构: Steffen, Thomas
- 优先权: US201161479132P 20110426
- 国际公布: WO2012153209 20121115
- 主分类号: G01N21/27
- IPC分类号: G01N21/27 ; G01N21/35 ; G01N3/10
摘要:
An infrared detector includes a radiation source configured to emit electromagnetic radiation. The detector includes a source monitoring apparatus configured to generate output signals (62) related to electrical resistance through the radiation source. The output signals are used to account for radiation source temperature in measurements by the detector. The output signals may be used (72) in the provision of power to the radiation source to maintain the temperature of the detector at a beneficial level. The detector is configured to monitor a level of a gaseous molecular species within a flow of breathable gas.
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