发明公开
- 专利标题： Sample preparation apparatus and sample preparation method
- 专利标题（中）： 样品制备装置和样品制备方法
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申请号： EP13185116.4申请日： 2013-09-19
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公开(公告)号： EP2733476A3公开(公告)日： 2018-01-17
- 发明人: Ebi, Ryuichiro , Tajima, Koki , Suganuma, Toshikuni
- 申请人： SYSMEX CORPORATION
- 申请人地址： 5-1, Wakinohama-Kaigandori 1-chome, Chuo-ku Kobe-shi, Hyogo 651-0073 JP
- 专利权人： SYSMEX CORPORATION
- 当前专利权人： SYSMEX CORPORATION
- 当前专利权人地址： 5-1, Wakinohama-Kaigandori 1-chome, Chuo-ku Kobe-shi, Hyogo 651-0073 JP
- 代理机构： Hoffmann Eitle
- 优先权： JP2012217636 20120928
- 主分类号： G01N1/28
- IPC分类号： G01N1/28 ; G01N35/02 ; G01N15/14 ; G01N1/40
摘要：
A sample preparation apparatus is provided. The apparatus comprises a first receiving part, a second receiving part, a filter part, a third receiving part, a flow path, a first moving means and a second moving means. The first receiving part is configured to accept a pipette and to receive a sample discharged from a pipette. The second receiving part is disposed at a position removed from the first receiving part in the plane of view. The filter part is configured to retain the cells to be analyzed within the second receiving part. The third receiving part is disposed opposite the second receiving part through the filter part The flow path is configured to connect the first receiving part and the second receiving part The first moving means is for moving a sample that has been received at the first receiving part to the filter part through the flow path and the second receiving part, and moving the components other than the cells to be analyzed to the third receiving part through the filter part. The second moving means is for moving the cells to be analyzed in the second receiving part from the second receiving part to the first receiving part.
公开/授权文献
- EP2733476B1 Sample preparation apparatus and sample preparation method 公开/授权日：2019-06-12
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