发明公开
- 专利标题： MEASUREMENT APPARATUS AND METHOD
- 专利标题（中）： MESSVORRICHTUNG外展
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申请号： EP12798800.4申请日： 2012-11-21
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公开(公告)号： EP2783199A1公开(公告)日： 2014-10-01
- 发明人: THENNADIL, Suresh N. , CHEN, Yi-Chieh
- 申请人： University of Strathclyde
- 申请人地址： McCance Building 16 Richmond Street Glasgow G1 1XQ GB
- 专利权人： University of Strathclyde
- 当前专利权人： University of Strathclyde
- 当前专利权人地址： McCance Building 16 Richmond Street Glasgow G1 1XQ GB
- 代理机构： Kinsler, Maureen Catherine
- 优先权： GB201120075 20111121
- 国际公布： WO2013076475 20130530
- 主分类号： G01N21/03
- IPC分类号： G01N21/03 ; G01N21/47
摘要：
A measurement system (5) comprises a radiation source (10) and a detection system (15), wherein the radiation source is arranged such that radiation from the radiation source is incident on a sample (25) and the detection system is configured to receive at least part of the radiation via the sample, wherein the system is reconfigurable so as to vary a path length that the radiation travels through the sample and/or a reflectance of at least one surface upon which the radiation is incident after passing through at least part of the sample. A prop¬ erty of the sample may be determined based on at least the first and second measurements.
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