发明公开
EP2818730A1 Method and apparatus for assessment and optimization of performance of piezoelectric devices
审中-公开
方法和装置用于评估和优化压电器件的性能
- 专利标题: Method and apparatus for assessment and optimization of performance of piezoelectric devices
- 专利标题(中): 方法和装置用于评估和优化压电器件的性能
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申请号: EP13305902.2申请日: 2013-06-27
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公开(公告)号: EP2818730A1公开(公告)日: 2014-12-31
- 发明人: Jeffers, Nicholas , Frizzell, Ronan , Donnelly, Brian
- 申请人: ALCATEL LUCENT
- 申请人地址: 148/152 route de la Reine 92100 Boulogne-Billancourt FR
- 专利权人: ALCATEL LUCENT
- 当前专利权人: ALCATEL LUCENT
- 当前专利权人地址: 148/152 route de la Reine 92100 Boulogne-Billancourt FR
- 代理机构: Shamsaei Far, Hassan
- 主分类号: F04D33/00
- IPC分类号: F04D33/00 ; G01R29/22 ; H01L41/09
摘要:
A method, an apparatus and a cooling arrangement are disclosed. In a first switching configuration, electric excitation is applied to a piezofan (11,21) having a piezoelectric element (111) attached to a planar body (112), causing the planar body to move. In a second switching configuration, the piezoelectric element is coupled to a processor (24). The processor receives an electric signal generated by the piezoelectric element caused by a movement of the planar body in the second switching configuration and generates data corresponding to said electric signal for assessing a performance of the piezofan.
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