发明公开
EP2873160A2 SYSTEMS, METHODS, AND APPARATUS FOR DETECTION OF METAL OBJECTS IN A PREDETERMINED SPACE
审中-公开
系统，检测金属物体的方法和设备，给定空间
- 专利标题： SYSTEMS, METHODS, AND APPARATUS FOR DETECTION OF METAL OBJECTS IN A PREDETERMINED SPACE
- 专利标题（中）： 系统，检测金属物体的方法和设备，给定空间
-
申请号： EP13742084.0申请日： 2013-07-10
-
公开(公告)号： EP2873160A2公开(公告)日： 2015-05-20
- 发明人: WIDMER, Hanspeter , BITTNER, Markus , SIEBER, Lukas , FISCHER, Marcel
- 申请人： Qualcomm Incorporated
- 申请人地址： Attn: International IP Administration 5775 Morehouse Drive San Diego, CA 92121-1714 US
- 专利权人： Qualcomm Incorporated
- 当前专利权人： Qualcomm Incorporated
- 当前专利权人地址： Attn: International IP Administration 5775 Morehouse Drive San Diego, CA 92121-1714 US
- 代理机构： Catesby, Olivia Joanne
- 优先权： US201261671498P 20120713; US201313791585 20130308
- 国际公布： WO2014011776 20140116
- 主分类号： H04B5/00
- IPC分类号： H04B5/00
摘要：
This disclosure provides systems, methods and apparatus for detecting foreign objects. In one aspect an apparatus for detecting a presence of an object in a magnetic field is provided. The apparatus includes a power circuit configured to generate the magnetic field and transfer power wirelessly at a level sufficient to power or charge a load via the magnetic field. The apparatus further includes a detection circuit configured to transmit signals and detect, based on a reflection of the transmitted signals, a frequency of vibration of the object caused by the magnetic field.
信息查询
