Invention Grant
- Patent Title: STORAGE-DEVICE-STATE DETECTION METHOD
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Application No.: EP13852885.6Application Date: 2013-11-07
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Publication No.: EP2919028B1Publication Date: 2018-06-20
- Inventor: HEBIGUCHI, Hiroyuki
- Applicant: Alps Electric Co., Ltd.
- Applicant Address: 1-7, Yukigaya-otsukamachi Ota-ku Tokyo, 145-8501 JP
- Assignee: Alps Electric Co., Ltd.
- Current Assignee: Alps Electric Co., Ltd.
- Current Assignee Address: 1-7, Yukigaya-otsukamachi Ota-ku Tokyo, 145-8501 JP
- Agency: Schmitt-Nilson Schraud Waibel Wohlfrom Patentanwälte Partnerschaft mbB
- Priority: JP2012248512 20121112
- International Announcement: WO2014073208 20140515
- Main IPC: G01R31/36
- IPC: G01R31/36 ; H01M10/48
Abstract:
[Object] To provide to a storage device state detection method of accurately detecting the state of health (SOH) and state of charge (SOC) of a storage device. [Solution] In a state detection method, for a storage device (1), in which the SOH or SOC of the storage device (1) is inferred from the internal impedance of the storage device (1): the internal resistance of the storage device (1) is measured by using a signal with a first frequency at which the internal impedance of the storage device (1) is reduced as a temperature is raised, and the initial SOH or initial SOC of the storage device (1) is calculated from the measured value of this internal resistance; the internal impedance of the storage device (1) is measured by using a signal with a second frequency at which the internal impedance of the storage device (1) is increased as a temperature is raised, and the internal temperature of the storage device (1) is calculated from the measured impedance value of this internal impedance; and the SOH or SOC is inferred by using the calculated value of the internal temperature to correct the initial SOH or initial SOC.
Public/Granted literature
- EP2919028A1 STORAGE-DEVICE-STATE DETECTION METHOD Public/Granted day:2015-09-16
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