- 专利标题: STORAGE-DEVICE-STATE DETECTION METHOD
-
申请号: EP13852885.6申请日: 2013-11-07
-
公开(公告)号: EP2919028B1公开(公告)日: 2018-06-20
- 发明人: HEBIGUCHI, Hiroyuki
- 申请人: Alps Electric Co., Ltd.
- 申请人地址: 1-7, Yukigaya-otsukamachi Ota-ku Tokyo, 145-8501 JP
- 专利权人: Alps Electric Co., Ltd.
- 当前专利权人: Alps Electric Co., Ltd.
- 当前专利权人地址: 1-7, Yukigaya-otsukamachi Ota-ku Tokyo, 145-8501 JP
- 代理机构: Schmitt-Nilson Schraud Waibel Wohlfrom Patentanwälte Partnerschaft mbB
- 优先权: JP2012248512 20121112
- 国际公布: WO2014073208 20140515
- 主分类号: G01R31/36
- IPC分类号: G01R31/36 ; H01M10/48
摘要:
[Object] To provide to a storage device state detection method of accurately detecting the state of health (SOH) and state of charge (SOC) of a storage device. [Solution] In a state detection method, for a storage device (1), in which the SOH or SOC of the storage device (1) is inferred from the internal impedance of the storage device (1): the internal resistance of the storage device (1) is measured by using a signal with a first frequency at which the internal impedance of the storage device (1) is reduced as a temperature is raised, and the initial SOH or initial SOC of the storage device (1) is calculated from the measured value of this internal resistance; the internal impedance of the storage device (1) is measured by using a signal with a second frequency at which the internal impedance of the storage device (1) is increased as a temperature is raised, and the internal temperature of the storage device (1) is calculated from the measured impedance value of this internal impedance; and the SOH or SOC is inferred by using the calculated value of the internal temperature to correct the initial SOH or initial SOC.
公开/授权文献
- EP2919028A1 STORAGE-DEVICE-STATE DETECTION METHOD 公开/授权日:2015-09-16
信息查询