This invention provides a goods inspection apparatus using distributed X-ray source, comprising: a frame; a goods passage; a goods conveyor; a distributed X-ray source for producing X-ray at different positions successively within each working cycle; a detector array for receiving the X-ray from the distributed X-ray source and outputting signals indicating the strength of the X-ray; an electronics system for receiving signals from the detectors, converting the signals into digital ones, and forming a data packet with the position numbers of corresponding detectors, outputting a sequence of data packets formed by the position numbers and signals from the plurality of detectors of the detector array; an image processing system for receiving the output from the electronics system, processing the position numbers of detectors and the corresponding signals indicating the strength of X-ray, constructing to form an image of the object under inspection; a ray source power supply for providing power to the distributed X-ray source; and a control system for exercising logical control over the respective parts to enable the respective sub-systems to work in coordination.