Invention Publication
- Patent Title: DYNAMIC LIGHT SCATTERING MEASUREMENT DEVICE AND DYNAMIC LIGHT SCATTERING MEASUREMENT METHOD
- Patent Title (中): 用于测量动态光散射和法测量动态光散射
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Application No.: EP15172822.7Application Date: 2015-06-19
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Publication No.: EP2960635A1Publication Date: 2015-12-30
- Inventor: Izutani, Yusuke , Iwai, Toshiaki
- Applicant: OTSUKA ELECTRONICS CO., LTD. , National University Corporation Tokyo University of Agriculture and Technology
- Applicant Address: 3-26-3, Shodai-tajika Hirakata-shi Osaka 573-1132 JP
- Assignee: OTSUKA ELECTRONICS CO., LTD.,National University Corporation Tokyo University of Agriculture and Technology
- Current Assignee: OTSUKA ELECTRONICS CO., LTD.,National University Corporation Tokyo University of Agriculture and Technology
- Current Assignee Address: 3-26-3, Shodai-tajika Hirakata-shi Osaka 573-1132 JP
- Agency: MERH-IP Matias Erny Reichl Hoffmann Patentanwälte PartG mbB
- Priority: JP2014127259 20140620
- Main IPC: G01J3/44
- IPC: G01J3/44 ; G01J9/02 ; G01N15/02 ; G01N21/45 ; G01N21/51
Abstract:
A dynamic light scattering measurement device (1) includes an irradiation section that applies light emitted from a low-coherence light source (10) to a sample (40) that includes particles (42), a spectral intensity acquisition section (62) that disperses reflected light from a reference plane and scattered light from the sample (40) that has passed through the reference plane to acquire a spectral intensity of interference light of the reflected light and the scattered light, the reference plane being situated to intersect an optical path through which the light is applied to the sample, and a measurement section (80) that measures dynamic light scattering of the sample (40) based on the acquired spectral intensity.
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