System for analysing, by laser induced plasma spectroscopy, the composition of the surface layer of a material and for taking samples with a view to performing complementary analyses or examining this superficial layer, and method related thereto. The system comprises a single pulse laser (6), for generating a pulse laser beam, able to interact with the superficial layer of the material and produce a plasma on the surface of the material (4); a device (10, 12) for focusing the laser beam onto the surface of the material; a device (18, 20) for collecting the light emitted by the plasma; and a device (22) for analysing the spectrum of the collected light and for determining the elementary composition (nature and relative concentration of the elements) of the superficial layer from this spectral analysis. According to the invention, it furthermore comprises a device (30, 32, 34) for sucking up and collecting particles representative of the superficial layer, extracted from the latter, under the effect of the laser beam, with a view to performing qualitative or quantitative complementary analyses or examininations on the basis of said particles.