发明公开
- 专利标题: LEED FOR SEM
- 专利标题(中): SEM的LEED
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申请号: EP14797934.8申请日: 2014-05-14
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公开(公告)号: EP2997590A1公开(公告)日: 2016-03-23
- 发明人: SHINTAKE, Tsumoru
- 申请人: Okinawa Institute of Science and Technology School Corporation
- 申请人地址: 1919-1 Tancha Onna-son Kunigami-gun, Okinawa 904-0495 JP
- 专利权人: Okinawa Institute of Science and Technology School Corporation
- 当前专利权人: Okinawa Institute of Science and Technology School Corporation
- 当前专利权人地址: 1919-1 Tancha Onna-son Kunigami-gun, Okinawa 904-0495 JP
- 代理机构: Wilding, Frances Ward
- 优先权: US201361823507P 20130515
- 国际公布: WO2014185074 20141120
- 主分类号: H01J37/244
- IPC分类号: H01J37/244 ; G01N23/20 ; H01J37/295
摘要:
A low energy electron diffraction (LEED) detection module (100) includes: a first vacuum chamber for receiving diffracted electrons from a specimen (109); a larger second vacuum chamber connected to the first vacuum chamber to receive the diffracted electrons that have been transported through the first vacuum chamber; a two-dimensional electron detector disposed in the second vacuum chamber to detect the diffracted electrons; a potential shield (106) disposed generally along an inner surface of the first vacuum chamber and an inner surface of the second vacuum chamber; a magnetic lens (105) to expand a beam of the diffracted electrons that have been transported through the first vacuum chamber towards the two-dimensional electron detector; and a generally plane-shaped energy filter (103) to repel electrons having an energy lower than the probe beam (203) of electrons that impinges on the specimen (109).
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