发明公开
- 专利标题: Multi-band testing method and apparatus
- 专利标题(中): Mehrband-Testverfahren und -vorrichtung
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申请号: EP14306569.6申请日: 2014-10-06
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公开(公告)号: EP3007376A1公开(公告)日: 2016-04-13
- 发明人: Bitzer, Thomas , Ng, Man Hung
- 申请人: ALCATEL LUCENT
- 申请人地址: 148/152 route de la Reine 92100 Boulogne-Billancourt FR
- 专利权人: ALCATEL LUCENT
- 当前专利权人: ALCATEL LUCENT
- 当前专利权人地址: 148/152 route de la Reine 92100 Boulogne-Billancourt FR
- 代理机构: Huber, Meik
- 主分类号: H04B17/29
- IPC分类号: H04B17/29 ; H04B17/15 ; H04B17/00
摘要:
The present invention relates to a method and apparatus for multi-band testing. A first multi-carrier signal in a lower frequency band of the maximum radio bandwidth of the multi-band transmitter is received. The first multi-carrier signal has a narrowband carrier located at the higher edge of the lower frequency band and a wideband carrier. A second multi-carrier signal in a higher frequency band of the maximum radio bandwidth of the multi-band transmitter is received. The second multi-carrier signal has a narrowband carrier located at the lower edge of the higher frequency band and a wideband carrier. Between the lower frequency band and the higher frequency band, a frequency gap is present. The wideband carrier in the lower frequency band is located in the lower frequency band such that its third order intermodulation product with the narrowband carrier in the lower frequency band is generated in the middle of the frequency gap. The wideband carrier in the higher frequency band is located in the higher frequency band such that its third order intermodulation product with the narrowband carrier in the higher frequency band is generated in the middle of the frequency gap. The transmitter test is performed with the first and second signal.
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