发明公开
EP3019822A1 DISPOSITIF OPTIQUE DE MESURE D'UN PARAMÈTRE PHYSIQUE ET PROCÉDÉ ASSOCIÉ
有权
光学装置用于测量物理参数和相关方法
- 专利标题： DISPOSITIF OPTIQUE DE MESURE D'UN PARAMÈTRE PHYSIQUE ET PROCÉDÉ ASSOCIÉ
- 专利标题（英）： Optical device for measuring a physical parameter and associated method
- 专利标题（中）： 光学装置用于测量物理参数和相关方法
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申请号： EP14738460.6申请日： 2014-07-04
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公开(公告)号： EP3019822A1公开(公告)日： 2016-05-18
- 发明人: BOSCH, Thierry , BONY, Francis , LUNA ARRIAGA, Antonio
- 申请人： Institut National Polytechnique de Toulouse (INPT) , Centre National de la Recherche Scientifique (CNRS)
- 申请人地址： 6 allée Emile Monso B.P. 34038 31029 Toulouse Cedex 4 FR
- 专利权人： Institut National Polytechnique de Toulouse (INPT),Centre National de la Recherche Scientifique (CNRS)
- 当前专利权人： Institut National Polytechnique de Toulouse (INPT),Centre National de la Recherche Scientifique (CNRS)
- 当前专利权人地址： 6 allée Emile Monso B.P. 34038 31029 Toulouse Cedex 4 FR
- 代理机构： Ipside
- 优先权： FR1356675 20130708
- 国际公布： WO2015004026 20150115
- 主分类号： G01B9/02
- IPC分类号： G01B9/02
摘要：
The invention relates to an optical device (10) for determining a physical parameter which comprises: a laser diode (11) for emitting a beam toward a target; a means for detecting (13) an interferometric signal SM(t) which comprises the information on the physical parameter to be determined, and which is generated by an interference between the emitted beam and a light beam reflected by the target; means for converting (15) the signal SM(t) obtained by the detection means (13) into a measurement of the physical parameter, said conversion means (15) comprising: first means (17) for suppressing a continuous component Off(t) of the interferometric signal SM(t); second means (18) for determining interferometric peaks in the interferometric signal SM(t) obtained from the signal obtained at the output of the first means (17). The invention also relates to an associated method. Said method is particularly suitable for speckle interferometric signals.
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