发明公开
- 专利标题: TRUE DENSITY MEASUREMENT DEVICE
- 专利标题(中): 真密度测量装置
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申请号: EP15740688.5申请日: 2015-01-22
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公开(公告)号: EP3098588A1公开(公告)日: 2016-11-30
- 发明人: NAKAI, Kazuyuki , YAMAZAKI, Hiromi , NAKAMURA, Kaori , GOUMOTO, Takayuki
- 申请人: Microtracbel Corp.
- 申请人地址: 8-2-52, Nankou-Higashi Suminoe-ku Osaka-shi, Osaka 559-0031 JP
- 专利权人: Microtracbel Corp.
- 当前专利权人: Microtracbel Corp.
- 当前专利权人地址: 8-2-52, Nankou-Higashi Suminoe-ku Osaka-shi, Osaka 559-0031 JP
- 代理机构: von Hirschhausen, Helge
- 优先权: JP2014010211 20140123
- 国际公布: WO2015111651 20150730
- 主分类号: G01N9/26
- IPC分类号: G01N9/26 ; G01N9/02
摘要:
This true density measurement device (10) is a device that is used to measure the true density of a sample (100) by a gas phase substitution method, and is provided with: a sample chamber (30) for accommodating the sample (100), the sample chamber (30) being pressurized through the introduction of an inert gas; and an expansion chamber (50) into which is released the inert gas filling the sample chamber (30). The expansion chamber (50), under conditions of normal use, is opened and closed by a detachable cover (42), and the volume thereof is modified by insertion or withdrawal of a volume modification member (55).
公开/授权文献
- EP3098588B1 TRUE DENSITY MEASUREMENT DEVICE 公开/授权日:2019-08-07
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