A system for monitoring a component (10) is provided. The system includes an electrical field scanner (60) for analyzing an electrical field across a reference zone (40), and a processor (100) in operable communication with the electrical field scanner (60). The reference zone (40) may include a plurality of fiducials (42) configured on the component (10) to influence the electrical field. The processor (100) may be operable for measuring (210) an electrical field value along a mutually-orthogonal X-axis and Y-axis, assembling (220) a zone profile including a data point set according to the measured electrical field value. Methods of using the system are also provided.