发明公开
- 专利标题: PLANOGRAM MATCHING
- 专利标题(中): 平面匹配
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申请号: EP16203064.7申请日: 2016-12-09
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公开(公告)号: EP3182349A3公开(公告)日: 2017-06-28
- 发明人: SCHWARTZ, Edward L.
- 申请人: Ricoh Company, Ltd.
- 申请人地址: 3-6, Nakamagome 1-chome Ohta-ku Tokyo 143-8555 JP
- 专利权人: Ricoh Company, Ltd.
- 当前专利权人: Ricoh Company, Ltd.
- 当前专利权人地址: 3-6, Nakamagome 1-chome Ohta-ku Tokyo 143-8555 JP
- 代理机构: Schwabe - Sandmair - Marx
- 优先权: US201562269899P 20151218; US201615164633 20160525
- 主分类号: G06Q10/08
- IPC分类号: G06Q10/08 ; G06K9/46 ; G06K9/62
摘要:
Methods and systems for planogram matching are described. The methods include capturing an image, processing the image to identify a product based on a symbolic identifier, receiving a planogram, identifying a region of a planogram based on a linear grouping, determining a geometrically consistent match between the product and a sample product included in the region of the planogram, and determining an alignment between the region of the planogram and a corresponding region of the image that includes the product. The methods may further include determining a location in the corresponding region that does not include an expected product based on the planogram.
公开/授权文献
- EP3182349A2 PLANOGRAM MATCHING 公开/授权日:2017-06-21
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