An apparatus (200) for particle characterisation, comprising: a sample cell (210) for holding a sample (215); a light source (220) configured to illuminate the sample (215) with an illuminating beam (230) and a plurality of light detectors (240, 241, 242), each light detector (240, 241, 242) configured to receive scattered light resulting from the interaction between the illuminating beam (230) and the sample (215) along a respective detector path (250, 251, 252), wherein each respective detector path (250, 251, 252) is at substantially the same angle (260) to the illuminating beam (230).