发明公开
- 专利标题: STRUCTURAL DAMAGE DETECTION
- 专利标题(中): 结构损伤检测
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申请号: EP16700667.5申请日: 2016-01-12
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公开(公告)号: EP3245493A1公开(公告)日: 2017-11-22
- 发明人: CHEN, Jiye , MAMAND, Heman
- 申请人: BAE Systems PLC
- 申请人地址: 6 Carlton Gardens London SW1Y 5AD GB
- 专利权人: BAE Systems PLC
- 当前专利权人: BAE Systems PLC
- 当前专利权人地址: 6 Carlton Gardens London SW1Y 5AD GB
- 代理机构: BAE SYSTEMS plc Group IP Department
- 优先权: GB201500496 20150113; EP15275007 20150113
- 国际公布: WO2016113551 20160721
- 主分类号: G01M5/00
- IPC分类号: G01M5/00 ; G01N3/06 ; G01B11/16 ; G01N21/88
摘要:
Disclosed is a method of assessing a structural defect presence in a structure, the method comprising the steps of: determining at least one critical damage strain value of the structure, capturing a first image of a surface of the structure under a first loading condition; capturing a second image of the surface of the structure under a second loading condition; assigning a position matrix on the captured first image; obtaining a deformation matrix comprising a deformation value at each position of the position matrix by using an image correlation technique on the first and second images, and by comparing deformation of corresponding parts of the surface captured therein; calculating a strain matrix using the obtained deformation matrix; and determining a micro-crack to be present at a position if an element of the strain matrix representing the strain at the position is greater than or equal to a predetermined critical damage strain value, wherein the critical damage strain value is a strain value at which a micro-crack is detected or predicted to appear and/or propagate.
公开/授权文献
- EP3245493B1 STRUCTURAL DAMAGE DETECTION 公开/授权日:2019-03-13
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