发明公开
- 专利标题: A MULTI-SLIT SPECTROMETER
- 专利标题(中): 多缝光谱仪
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申请号: EP17176236.2申请日: 2017-06-15
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公开(公告)号: EP3260828A1公开(公告)日: 2017-12-27
- 发明人: PANT, Priyadarshan Divyadarshan
- 申请人: Metal Power Analytical (I) Pvt. Ltd.
- 申请人地址: Metal Power House 87, Marol Industrial Estate Marol, Andheri (E), Bharat. Mumbai 400059 IN
- 专利权人: Metal Power Analytical (I) Pvt. Ltd.
- 当前专利权人: Metal Power Analytical (I) Pvt. Ltd.
- 当前专利权人地址: Metal Power House 87, Marol Industrial Estate Marol, Andheri (E), Bharat. Mumbai 400059 IN
- 代理机构: Swindell & Pearson Limited
- 优先权: IN201621021316 20160621
- 主分类号: G01J3/443
- IPC分类号: G01J3/443 ; G01J3/04 ; G01J3/18 ; G01J3/32 ; G01J3/02
摘要:
The present disclosure relates to the field of optical systems, in particular to an atomic emission spectrometer. The envisaged multi-scan optical system (100) is compact and stable. The system comprises an excitation source (104), a hydra fiber cable (106), a wavelength selector (103), a dispersive optical element (101), and a detector (102). The excitation source is configured to emit composite light. The hydra fiber cable has a head and a plurality of tentacles, and is configured to receive the composite light via a second lens. The plurality of tentacles is configured to emit the composite light towards the wavelength selector which includes a plurality of optical slits (s1 - s8) and a plurality of shutters. The wavelength selector is configured to selectively collect and filter the composite light directed by a first lens and the plurality of tentacles by means of the plurality of shutters. The detector is configured to detect the plurality of spectral line scans reflected by the dispersive optical element for spectrometric analysis.
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