发明公开
EP3264076A1 STRUCTURE ASSESSMENT SYSTEM, STRUCTURE ASSESSMENT DEVICE AND STRUCTURE ASSESSMENT METHOD
审中-公开
结构评估系统,结构评估装置和结构评估方法
- 专利标题: STRUCTURE ASSESSMENT SYSTEM, STRUCTURE ASSESSMENT DEVICE AND STRUCTURE ASSESSMENT METHOD
- 专利标题(中): 结构评估系统,结构评估装置和结构评估方法
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申请号: EP17707456.4申请日: 2017-03-06
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公开(公告)号: EP3264076A1公开(公告)日: 2018-01-03
- 发明人: WATABE, Kazuo , TAKAMINE, Hidefumi , SHIOTANI, Tomoki
- 申请人: Kabushiki Kaisha Toshiba, Aka Toshiba Corporation , KYOTO UNIVERSITY
- 申请人地址: 1-1 Shibaura 1-chome Minato-ku Tokyo 105-8001 JP
- 专利权人: Kabushiki Kaisha Toshiba, Aka Toshiba Corporation,KYOTO UNIVERSITY
- 当前专利权人: Kabushiki Kaisha Toshiba, Aka Toshiba Corporation,KYOTO UNIVERSITY
- 当前专利权人地址: 1-1 Shibaura 1-chome Minato-ku Tokyo 105-8001 JP
- 代理机构: Moreland, David
- 优先权: JP2016098951 20160517
- 国际公布: WO2017199542 20171123
- 主分类号: G01N29/14
- IPC分类号: G01N29/14 ; G01N29/06 ; G01N29/07
摘要:
According to an embodiment, a structure evaluation system includes a plurality of AE sensors, a signal processor, a position locator, a velocity calculator, and an evaluator. The AE sensors detect an elastic wave generated from a structure. The signal processor extracts an AE signal including information on the elastic wave by performing signal processing on the elastic wave detected by the AE sensor. The position locator derives a wave source distribution indicating a distribution of sources of the elastic waves generated in the structure on the basis of the AE signals. The velocity calculator derives a propagation velocity of the elastic wave generated in the structure on the basis of the AE signal. The evaluator evaluates the soundness of the structure on the basis of the wave source distributions and the propagation velocity of the elastic waves.
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