发明公开
- 专利标题: A MEMORY DEVICE FOR A DYNAMIC RANDOM ACCESS MEMORY
- 专利标题(中): 一种用于动态随机存取存储器的存储器设备
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申请号: EP17195862.2申请日: 2017-10-11
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公开(公告)号: EP3309789A1公开(公告)日: 2018-04-18
- 发明人: VAN HOUDT, Jan , RYCKAERT, Julien , OH, Hyungrock
- 申请人: IMEC vzw
- 申请人地址: Kapeldreef 75 3001 Leuven BE
- 专利权人: IMEC vzw
- 当前专利权人: IMEC vzw
- 当前专利权人地址: Kapeldreef 75 3001 Leuven BE
- 代理机构: Awapatent AB
- 优先权: EP16193247 20161011
- 主分类号: G11C11/405
- IPC分类号: G11C11/405 ; G11C11/4097
摘要:
According to an aspect of the present inventive concept there is provided a memory device for a dynamic random access memory, DRAM, comprising:
a substrate supporting a semiconductor device layer in which a plurality of semiconductor devices are formed,
an interconnection portion formed above the substrate and including a number of metallization levels and dielectric layers, the interconnection portion being adapted to interconnect said semiconductor devices,
a plurality of bit cell stacks arranged in the interconnection portion, each bit cell stack including a plurality of bit cells, each bit cell including:
a charge storage element, a write transistor and a read transistor, wherein the write transistor includes a gate electrode connected to a write select line and a first electrode connected to a write bit line, wherein the charge storage element includes a first portion connected to a read select line and a second portion connected to a second electrode of the write transistor and to a gate electrode of the read transistor, and wherein the read transistor includes an electrode connected to a sense line,
a driver circuitry adapted to during a read mode apply a voltage to a read select line connected to a bit cell such that a gate voltage of the read transistor of said bit cell, on a condition that a first charge is stored by the charge storage element of said bit cell, is shifted to a first voltage which is smaller than a threshold voltage of the read transistor and, on a condition that a second charge is stored by the charge storage element of said bit cell, is shifted to a second voltage which is equal to or greater than the threshold voltage of the read transistor, and
a plurality of gain transistors formed in said semiconductor device layer, each gain transistor being connected to a respective one of said bit stacks via the sense lines connected to the read transistor of each bit cell of said respective bit stack and being adapted to output an amplified read out signal.
a substrate supporting a semiconductor device layer in which a plurality of semiconductor devices are formed,
an interconnection portion formed above the substrate and including a number of metallization levels and dielectric layers, the interconnection portion being adapted to interconnect said semiconductor devices,
a plurality of bit cell stacks arranged in the interconnection portion, each bit cell stack including a plurality of bit cells, each bit cell including:
a charge storage element, a write transistor and a read transistor, wherein the write transistor includes a gate electrode connected to a write select line and a first electrode connected to a write bit line, wherein the charge storage element includes a first portion connected to a read select line and a second portion connected to a second electrode of the write transistor and to a gate electrode of the read transistor, and wherein the read transistor includes an electrode connected to a sense line,
a driver circuitry adapted to during a read mode apply a voltage to a read select line connected to a bit cell such that a gate voltage of the read transistor of said bit cell, on a condition that a first charge is stored by the charge storage element of said bit cell, is shifted to a first voltage which is smaller than a threshold voltage of the read transistor and, on a condition that a second charge is stored by the charge storage element of said bit cell, is shifted to a second voltage which is equal to or greater than the threshold voltage of the read transistor, and
a plurality of gain transistors formed in said semiconductor device layer, each gain transistor being connected to a respective one of said bit stacks via the sense lines connected to the read transistor of each bit cell of said respective bit stack and being adapted to output an amplified read out signal.
公开/授权文献
- EP3309789B1 A MEMORY DEVICE FOR A DYNAMIC RANDOM ACCESS MEMORY 公开/授权日:2019-09-11
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