- 专利标题: SYSTEM AND METHOD FOR TESTING PHOTOSENSITIVE DEVICE DEGRADATION
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申请号: EP16849881.4申请日: 2016-09-26
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公开(公告)号: EP3353890A1公开(公告)日: 2018-08-01
- 发明人: IRWIN, Michael, D. , LOVELACE, Jerome , MIELCZAREK, Kamil
- 申请人: HEE Solar, L.L.C.
- 申请人地址: 1807 Ross Avenue, Suite 333 Dallas, TX 75201 US
- 专利权人: HEE Solar, L.L.C.
- 当前专利权人: HEE Solar, L.L.C.
- 当前专利权人地址: 1807 Ross Avenue, Suite 333 Dallas, TX 75201 US
- 代理机构: Barker Brettell LLP
- 优先权: US201562232088P 20150924
- 国际公布: WO2017053984 20170330
- 主分类号: H02S50/10
- IPC分类号: H02S50/10 ; G09G3/00 ; H05B33/10
摘要:
The performance of photosensitive devices over time may be tested by configuring a photosensitive device test system that includes a light source plate that exposes photosensitive devices within a container to a specified light intensity. The light intensity may be adjusted by a programmable power source according to one or more thresholds. A test may last for a set duration with performance measurements being taken at predetermined intervals throughout the duration. Feedback from the photosensitive device test system may be recorded to determine whether to increase light intensity, to stop testing, to continue testing, and whether one or more environmental conditions should be altered. Measurements may be sent to a client for analysis and display to a user.
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