发明公开
- 专利标题: SYSTEMS AND METHODS FOR IMPROVED FOCUS TRACKING USING A LIGHT SOURCE CONFIGURATION
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申请号: EP18160348.1申请日: 2018-03-06
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公开(公告)号: EP3376275A1公开(公告)日: 2018-09-19
- 发明人: Condello, Danilo , Prince, Simon , O'Shaughnessy, John , Sigel, Christophe , Arianpour, Ashkan
- 申请人: Illumina, Inc.
- 申请人地址: 5200 Illumina Way San Diego, CA 92122 US
- 专利权人: Illumina, Inc.
- 当前专利权人: Illumina, Inc.
- 当前专利权人地址: 5200 Illumina Way San Diego, CA 92122 US
- 代理机构: Murgitroyd & Company
- 优先权: US201762468353P 20170307; NL2018857 20170505
- 主分类号: G02B21/24
- IPC分类号: G02B21/24
摘要:
Provided herein is an imaging system including a light source; a first focusing lens positioned to focus a beam from the light source to a beam waist at a predetermined location along an optical path of the beam in the imaging system; a beam splitter positioned relative to the first focusing lens to receive the beam from the first focusing lens and to create first and second beams; a second focusing lens positioned to receive the first and second beams output by the beam splitter, to focus the received first and second beams to a spot sized dimensioned to fall within a sample to be image, and further positioned to receive first and second beams reflected from the sample; an image sensor positioned to receive the light beams reflected from the sample; and a roof prism positioned in the optical path between the second focusing lens and the image sensor.
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