- 专利标题: MANUFACTURING METHOD FOR ALUMINUM NITRIDE SINGLE-CRYSTAL SUBSTRATE
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申请号: EP17770273.5申请日: 2017-03-22
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公开(公告)号: EP3434816A1公开(公告)日: 2019-01-30
- 发明人: NAGASHIMA, Toru , OKAYAMA, Reiko , FUKUDA, Masayuki , YANAGI, Hiroyuki
- 申请人: Tokuyama Corporation
- 申请人地址: 1-1 Mikage-cho Shunan-shi, Yamaguchi-ken 745-8648 JP
- 专利权人: Tokuyama Corporation
- 当前专利权人: Tokuyama Corporation
- 当前专利权人地址: 1-1 Mikage-cho Shunan-shi, Yamaguchi-ken 745-8648 JP
- 代理机构: Viering, Jentschura & Partner mbB Patent- und Rechtsanwälte
- 优先权: JP2016057838 20160323
- 国际公布: WO2017164233 20170928
- 主分类号: C30B29/38
- IPC分类号: C30B29/38 ; C23C16/01 ; C23C16/34 ; C30B25/20 ; H01L21/205
摘要:
A method for producing an aluminum nitride single crystal substrate, the method including: i) preparing a first base substrate consisting of a first aluminum nitride single crystal; ii) growing a first aluminum nitride single crystal layer having a thickness of no less than 500 µm over a main face of the first base substrate, to obtain a layered body; iii) cutting the first aluminum nitride single crystal layer of the layered body, to separate the layered body into a second base substrate and a first part of the first aluminum nitride single crystal layer, the second base substrate including the first base substrate and a thin film layered thereon, the thin film being a second part of the first aluminum nitride single crystal layer; iv) polishing a surface of the thin film in the second base substrate, to obtain a third base substrate consisting of a second aluminum nitride single crystal; and v) growing a second aluminum nitride single crystal layer over the polished surface of the third base substrate.
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