- 专利标题: SPECKLE MEASUREMENT DEVICE AND SPECKLE MEASUREMENT METHOD
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申请号: EP17778849.4申请日: 2017-02-07
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公开(公告)号: EP3440997A1公开(公告)日: 2019-02-13
- 发明人: AIZAWA, Kota , OKUBO, Atsushi , WAKITA, Yoshihiro
- 申请人: Sony Corporation
- 申请人地址: 1-7-1 Konan Minato-ku Tokyo 108-0075 JP
- 专利权人: Sony Corporation
- 当前专利权人: Sony Corporation
- 当前专利权人地址: 1-7-1 Konan Minato-ku Tokyo 108-0075 JP
- 代理机构: MFG Patentanwälte Meyer-Wildhagen Meggle-Freund Gerhard PartG mbB
- 优先权: JP2016075759 20160405
- 国际公布: WO2017175470 20171012
- 主分类号: A61B5/026
- IPC分类号: A61B5/026 ; G01B11/00 ; G01N21/49 ; G01P5/22
摘要:
[Object] To improve accuracy of flow velocity measurement or the like of particulates such as erythrocytes.
[Solving Means] A speckle measurement apparatus includes an imager that captures scattered light images returned from an object to be measured when the object to be measured is irradiated with coherent light as speckle images, and a controller that determines a measurement area that is the same site of the object to be measured in a plurality of the speckle images captured continuously in time series by the imager by incorporating a displacement amount of a relative positional relationship between the object to be measured and the imager.
[Solving Means] A speckle measurement apparatus includes an imager that captures scattered light images returned from an object to be measured when the object to be measured is irradiated with coherent light as speckle images, and a controller that determines a measurement area that is the same site of the object to be measured in a plurality of the speckle images captured continuously in time series by the imager by incorporating a displacement amount of a relative positional relationship between the object to be measured and the imager.
公开/授权文献
- EP3440997B1 SPECKLE MEASUREMENT DEVICE AND SPECKLE MEASUREMENT METHOD 公开/授权日:2020-11-25
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