X-ray scattering imaging can provide complementary information about the unresolved microstructures of a sample. The scattering signal can be accessed with various methods based on coherent illumination, which span from self-imaging to speckle scanning. The directional sensitivity of the existing methods is limited to a few directions on the imaging plane and it requires the scanning of the optical components, or the rotation of either the sample or the imaging setup, if the full range of possible scattering directions is desired. Recently such an invention has been presented. However, the method requires a very high resolution and is only applicable to imaging setups where this is possible, such as synchrotron facilities. The present invention discloses a new arrangement that allows the simultaneous acquisition of the scattering images in all possible directions in a single shot without the need of high resolution or highly coherence sources. This is achieved by a specialized optical element and means of recording the generated fringe with sufficient spatial resolution.