- 专利标题: INSPECTION METHOD AND MANUFACTURING METHOD OF ELECTRICAL STORAGE DEVICE
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申请号: EP18204554.2申请日: 2018-11-06
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公开(公告)号: EP3517986A2公开(公告)日: 2019-07-31
- 发明人: KOBAYASHI, Kiwamu , GOTO, Takeshi
- 申请人: TOYOTA JIDOSHA KABUSHIKI KAISHA
- 申请人地址: 1, Toyota-cho, Toyota-shi, Aichi-ken, 471-8571 JP
- 专利权人: TOYOTA JIDOSHA KABUSHIKI KAISHA
- 当前专利权人: TOYOTA JIDOSHA KABUSHIKI KAISHA
- 当前专利权人地址: 1, Toyota-cho, Toyota-shi, Aichi-ken, 471-8571 JP
- 代理机构: Winter, Brandl, Fürniss, Hübner, Röss, Kaiser, Polte - Partnerschaft mbB
- 优先权: JP2017248109 20171225
- 主分类号: G01R31/392
- IPC分类号: G01R31/392 ; G01R31/385 ; G01R31/389
摘要:
An inspection method of a present electrical storage device (1) includes: constituting a circuit (3) with the electrical storage device (1) being charged and a power supply (4), and passing a current (IB) by the power supply (4) to the circuit (3) in a direction of charging or discharging the electrical storage device (1); and in passing the current (IB), determining the quality of the electrical storage device (1) based on a converging state of the passing current (IB). In passing the current (IB), an output voltage (VS) of the power supply (4) is changed from an initial value with the passage of time.
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