- 专利标题: METHOD AND ELECTRONIC DEVICE FOR CORRECTING MEASUREMENT VALUE OF SENSOR
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申请号: EP18873650.8申请日: 2018-10-19
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公开(公告)号: EP3677924A1公开(公告)日: 2020-07-08
- 发明人: LEE, Jeehoon , MIN, Eungi , LEE, Yongjin , LEE, Suho , LIM, Sukwang , LIM, Hyungjoon , LEE, Seungeun
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: 129, Samsung-ro Yeongtong-gu Suwon-si, Gyeonggi-do 16677 KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: 129, Samsung-ro Yeongtong-gu Suwon-si, Gyeonggi-do 16677 KR
- 代理机构: HGF
- 优先权: KR20170146045 20171103
- 国际公布: WO2019088529 20190509
- 主分类号: G01R27/26
- IPC分类号: G01R27/26 ; H03K17/96 ; G06F3/044
摘要:
An electronic device according to various embodiments of the present invention may comprise: at least one electrode having conductivity; a capacitance sensor, at least one switch electrically connected between the at least one electrode and the capacitance sensor, and capable of selectively connecting the at least one electrode and the capacitance sensor; and a control circuit, wherein the control circuit measures a first capacitance value by using the capacitance sensor in a state where the at least one switch is open, measures a second capacitance value corresponding to an external object contacting the at least one electrode, by using the capacitance sensor in a state where the at least one switch is connected, corrects the second capacitance value by using the first capacitance value, and determines the corrected second capacitance value as a capacitance value for the external object. Various other embodiments are possible.
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