LEARNING METHOD AND LEARNING DEVICE FOR CONVOLUTIONAL NEURAL NETWORK USING 1×1 CONVOLUTION FOR IMAGE RECOGNITION TO BE USED FOR HARDWARE OPTIMIZATION, AND TESTING METHOD AND TESTING DEVICE USING THE SAME
摘要:
A method for learning parameters of a CNN for image recognition is provided to be used for hardware optimization which satisfies KPI. The method includes steps of: a learning device (1) instructing a first transposing layer or a pooling layer to generate an integrated feature map by concatenating each of pixels, per each of ROIs, in corresponding locations on pooled ROI feature maps; and (2) (i) instructing a second transposing layer or a classifying layer to divide an adjusted feature map, whose volume is adjusted from the integrated feature map, by each of the pixels, and instructing the classifying layer to generate object information on the ROIs, and (ii) backpropagating object losses. Size of a chip can be decreased as convolution operations and fully connected layer operations are performed by a same processor. Accordingly, there are advantages such as no need to build additional lines in a semiconductor manufacturing process.
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