发明公开
- 专利标题： MEASUREMENT SUCCESS/FAILURE DETERMINATION METHOD AND SAMPLE MEASUREMENT DEVICE
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申请号： EP20157372.2申请日： 2020-02-14
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公开(公告)号： EP3699574A1公开(公告)日： 2020-08-26
- 发明人: Takahashi, Yusuke , Yanagida, Masatoshi , Shirai, Kentaro , Ijiri, Yuichi , Iwanaga, Shigeki
- 申请人： SYSMEX CORPORATION
- 申请人地址： 5-1 Wakinohama-Kaigandori 1-chome Chuo-ku Kobe-shi Hyogo 651-0073 JP
- 专利权人： SYSMEX CORPORATION
- 当前专利权人： SYSMEX CORPORATION
- 当前专利权人地址： 5-1 Wakinohama-Kaigandori 1-chome Chuo-ku Kobe-shi Hyogo 651-0073 JP
- 代理机构： Hoffmann Eitle
- 优先权： JP2019028833 20190220
- 主分类号： G01N15/14
- IPC分类号： G01N15/14 ; G01N35/00 ; G01N15/10 ; G01N1/40
摘要：
The present invention provides a method for determining a success or failure of a measurement of a target particle contained in a measurement sample. The method includes: detecting the target particle and other particle other than the target particle in the measurement sample; and determining the success or failure of the measurement of the target particle based on at least a detection result of the other particle.
信息查询
