- 专利标题： BINOCULAR REFRACTION INSTRUMENT, SET OF TEST IMAGES, BINOCULAR REFRACTION METHOD AND COMPUTER PROGRAM ASSOCIATED THEREOF
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申请号： EP19305700.7申请日： 2019-05-31
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公开(公告)号： EP3744227A1公开(公告)日： 2020-12-02
- 发明人: LONGO, Adèle , MARIN, Gildas , HERNANDEZ-CASTANEDA, Martha
- 申请人： ESSILOR INTERNATIONAL
- 申请人地址： 147 rue de Paris 94220 Charenton-Le-Pont FR
- 专利权人： ESSILOR INTERNATIONAL
- 当前专利权人： ESSILOR INTERNATIONAL
- 当前专利权人地址： 147 rue de Paris 94220 Charenton-Le-Pont FR
- 代理机构： Jacobacci Coralis Harle
- 主分类号： A61B3/00
- IPC分类号： A61B3/00 ; A61B3/02 ; A61B3/028 ; A61B3/032 ; A61B3/08
摘要：
The invention concerns a couple of test images, for a binocular refraction method, that comprises:
- a first test image (21) to be provided to a first eye of a subject, comprising a central image (21c) surrounded by a first peripheral image (21p), this central image comprising at least one optotype (210); and
- a second test image (22) to be provided to a second eye of the subject, comprising a central image (22c) surrounded by a second peripheral image (22p) substantially identical to the first peripheral image, this central image being deprived of optotypes, or comprising only optotypes (22o) with a low contrast or sharpness level.
The invention concerns also an associated binocular refraction method and refraction instrument, and an associated computer program.
- a first test image (21) to be provided to a first eye of a subject, comprising a central image (21c) surrounded by a first peripheral image (21p), this central image comprising at least one optotype (210); and
- a second test image (22) to be provided to a second eye of the subject, comprising a central image (22c) surrounded by a second peripheral image (22p) substantially identical to the first peripheral image, this central image being deprived of optotypes, or comprising only optotypes (22o) with a low contrast or sharpness level.
The invention concerns also an associated binocular refraction method and refraction instrument, and an associated computer program.
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