发明公开
- 专利标题: PARTICLE MATTER ANALYSIS DEVICE, ANALYSIS METHOD AND MANUFACTURING METHOD THEREOF
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申请号: EP21175258.9申请日: 2021-05-21
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公开(公告)号: EP3919888A2公开(公告)日: 2021-12-08
- 发明人: KIM, Yong-Jun , KWON, Hong-Beom
- 申请人: Industry-Academic Cooperation Foundation, Yonsei University
- 申请人地址: KR Seoul 03722 50, Yonsei-ro Seodaemun-gu
- 代理机构: MacDougall, Alan John Shaw
- 优先权: KR20200066435 20200602
- 主分类号: G01N15/02
- IPC分类号: G01N15/02 ; B03C3/017 ; B03C3/02 ; B03C3/47 ; G01N15/06 ; G01N27/02 ; G01N27/66 ; G01N27/70 ; G01N1/22 ; B01D57/02 ; B03C3/38
摘要:
A particle matter analysis device, an analysis method and a manufacturing method are disclosed. The particle matter analysis device includes a charger configured to receive power from a power supply device and to charge particles included in intaken air, an electrophoretic mobility particle collector configured to collect particles having electrophoretic mobility greater than a predetermined electrophoretic mobility among the charged particles based on an electrophoretic mobility and to measure a current of electrophoretic mobility particles, an aerodynamic particle collector configured to collect charged particles passing through the electrophoretic mobility particle collector based on an inertial force of the charged particles and to measure a current of aerodynamic particles, a filter configured to collect charged particles passing through the aerodynamic particle collector and to measure a current of filtered particles, and a processor, wherein the processor calculates a density of the particles based on a ratio of the current of electrophoretic mobility particles, the current of aerodynamic particles, and the current of filtered particles.
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