Embodiments of the present specification provide a biometric feature attack object and a biometric feature attack test system. The biometric feature attack object includes a substrate, a biometric feature attachment part, and a conductive part. The substrate includes a biometric feature carrying area and a pressing area, and the biometric feature carrying area and the pressing area are respectively disposed on two opposite sides of the substrate. The biometric feature attachment part is disposed in the biometric feature carrying area, and the conductive part is disposed in the pressing area or the biometric feature carrying area.