- 专利标题: SYSTEM AND METHOD FOR CONSTRUCTING FAULT-AUGMENTED SYSTEM MODEL FOR ROOT CAUSE ANALYSIS OF FAULTS IN MANUFACTURING SYSTEMS
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申请号: EP21182988.2申请日: 2021-06-30
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公开(公告)号: EP3951533A1公开(公告)日: 2022-02-09
- 发明人: YU, Hong , RAGHAVAN, Ajay , MOSTAFAVI, Saman , JUNG, Deokwoo
- 申请人: Palo Alto Research Center Incorporated
- 申请人地址: US Webster, NY 14580 Office of General Counsel Property Law Department Attn: IP Documentation Center 800 Phillips Road, MS 105-20C
- 代理机构: Gill Jennings & Every LLP
- 优先权: US202017068613 20201012
- 主分类号: G05B23/02
- IPC分类号: G05B23/02
摘要:
A system is provided for determining causes of faults in a manufacturing system. The system stores data associated with a processing system which includes machines and associated processes, wherein the data includes timestamp information, machine status information, and product-batch information. The system determines, based on the data, a topology of the processing system, wherein the topology indicates flows of outputs between the machines as part of the processes. The system determines information of machine faults in association with the topology. The system generates, based on the machine-fault information, one or more fault parameters which indicates frequency and severity of a respective fault. The system constructs, based on the topology and the machine-fault information, a system model which includes the one or more fault parameters, thereby facilitating diagnosis of the processing system.
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