- 专利标题: A METHOD AND SYSTEM FOR ANALYSING OBJECTS
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申请号: EP21163502.4申请日: 2021-03-18
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公开(公告)号: EP4059411A1公开(公告)日: 2022-09-21
- 发明人: Palero, Jonathan Alambra , Damodaran, Mathivanan , Bourquin, Yannyk Parulian Julian , Verhagen, Rieko
- 申请人: Koninklijke Philips N.V.
- 申请人地址: NL 5656 AG Eindhoven High Tech Campus 52
- 代理机构: Philips Intellectual Property & Standards
- 主分类号: A61B5/00
- IPC分类号: A61B5/00 ; A61B5/1455
摘要:
According to an aspect, there is provided a method for analysing an object, the method comprising illuminating the object with illumination provided by at least two illumination sources, each illumination source being defined by at least one distinct characteristic property; temporally modulating the illumination provided by each illumination source according to a modulation function; capturing a plurality of image frames representing the object using a rolling shutter image sensor; and demultiplexing the plurality of image frames into component images each representing the object under illumination from a respective illumination source, and an ambient image representing the object under an ambient light condition.
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