STRUCTURED LIGHT PROJECTION FOR SPECULAR SURFACES
摘要:
A system (1100) for generating a three-dimensional height image of a reflective test target, the system comprising a plurality of illumination sources (1102) configured to generate a patterned illumination (1108) having a repeated pattern on the test target (1106); a plurality of cameras, each camera (1104) being configured to acquire an image of patterned illumination on the test target (1106) from a different azimuthal angle; the illumination sources (1102) and cameras (1104) being aligned relative to the test target (1106) and each other such that the camera (1104) acquires a specular image of the patterned illumination (1108) on the test target from at least one of the illumination sources. The system (1100) further including a controller (1454) coupled to the illumination sources (1102) and cameras (1104), the controller being configured to generate a height image of the test target (1106) by combining height images generated from each specularly aligned pattern illumination source and camera.
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