发明公开
- 专利标题: RADIATION INSPECTION SYSTEM
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申请号: EP22216819.7申请日: 2022-12-27
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公开(公告)号: EP4206749A1公开(公告)日: 2023-07-05
- 发明人: FAN, Xuping , SONG, Quanwei , SHI, Junping , HE, Yuan , MENG, Hui
- 申请人: Nuctech (Beijing) Company Limited , Nuctech Company Limited
- 申请人地址: CN Beijing 101500 No. 18, Yuanlin Road Economic Development Zone Miyun District; CN TongFang Building Shuangqinglu Road Haidian District Beijing 100084 2nd Floor, Block A
- 代理机构: Gunzelmann, Rainer
- 优先权: CN202111668939 20211230
- 主分类号: G01V5/00
- IPC分类号: G01V5/00 ; G01N23/046
摘要:
The present disclosure relates to a radiation inspection system, including: a radiation source (10), having an accelerator target point (11); and a detector arm, comprising an arm body (20) and a plurality of detecting modules (30), wherein the plurality of detecting modules (30) are arranged on the arm body (20) along a length direction of the arm body (20), each detecting module (30) comprises a circuit board (31) and a plurality of detector crystals (32) mounted on the circuit board (31), mounting directions of the plurality of detector crystals (32) in each detecting module (30) are parallel to each other, are arranged along a reference straight line (R) in the circuit board (31) and have a preset included angle relative to the reference straight line (R), and the plurality of detecting modules (30) correspond to at least two different preset included angles.
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