- 专利标题: APPARATUSES, SYSTEMS, AND METHODS FOR SAMPLE TESTING
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申请号: EP23213622.6申请日: 2023-12-01
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公开(公告)号: EP4389281A2公开(公告)日: 2024-06-26
- 发明人: VENKATARAYALU, Suresh , SHAFAI, Moin , FENG, Chen , BECK, Scott , HINSON, Donald , PHAM, Thuy-Doan
- 申请人: Hand Held Products, Inc.
- 申请人地址: US Charlotte, NC 28202 855 S. Mint Street
- 专利权人: Hand Held Products, Inc.
- 当前专利权人: Hand Held Products, Inc.
- 当前专利权人地址: US Charlotte, NC 28202 855 S. Mint Street
- 代理机构: Haseltine Lake Kempner LLP
- 优先权: US 2263476350P 2022.12.20
- 主分类号: B01L3/00
- IPC分类号: B01L3/00 ; G01N21/77
摘要:
Methods, apparatuses, and systems associated with a sample testing device are provided. A method for fabricating a waveguide device includes forming a stress reducing pattern on a thermal silicon dioxide layer, wherein the stress reducing pattern comprises a plurality of polygon pattern units; and forming a silicon nitride film on the stress reducing pattern. A parallel flow multichannel pathogen sensing system includes a multichannel peristaltic pump comprising a plurality of pump flow channel tubes, wherein a buffer solution flows through the plurality of pump flow channel tubes, an injection valve array comprising a plurality of injection valves, and a sensing channel connection port connected to a sensing channel input port on a waveguide fluidics assembly. The waveguide fluidics assembly comprises a parallel flow micro-fluidic cover defining a plurality of sensing channel input ports.
公开/授权文献
- EP4389281A3 APPARATUSES, SYSTEMS, AND METHODS FOR SAMPLE TESTING 公开/授权日:2024-10-02
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