- 专利标题: ION TRAP ARRAY FOR HIGH THROUGHPUT CHARGE DETECTION MASS SPECTROMETRY
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申请号: EP24174366.5申请日: 2019-01-11
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公开(公告)号: EP4391015A2公开(公告)日: 2024-06-26
- 发明人: JARROLD, Martin F. , BOTAMANENKO, Daniel
- 申请人: The Trustees of Indiana University
- 申请人地址: US Bloomington, IN 47405 107 S. Indiana Avenue
- 专利权人: The Trustees of Indiana University
- 当前专利权人: The Trustees of Indiana University
- 当前专利权人地址: US Bloomington, IN 47405 107 S. Indiana Avenue
- 代理机构: Schott, Jakob Valentin
- 优先权: US 1862680315P 2018.06.04
- 分案原申请号: 19702775.8 2019.01.11
- 主分类号: H01J49/42
- IPC分类号: H01J49/42
摘要:
An electrostatic linear ion trap (ELIT) array includes multiple elongated charge detection cylinders arranged end-to-end and each defining an axial passageway extending centrally therethrough, a plurality of ion mirror structures each defining a pair of axially aligned cavities and an axial passageway extending centrally therethrough, wherein a different ion mirror structure is disposed between opposing ends of each cylinder, and front and rear ion mirrors each defining at least one cavity and an axial passageway extending centrally therethrough, the front ion mirror positioned at one end of the arrangement of charge detection cylinders and the rear ion mirror positioned at an opposite end of the arrangement of charge detection cylinders, wherein the axial passageways of the charge detection cylinders, the ion mirror structures, the front ion mirror and the rear ion mirror are coaxial to define a longitudinal axis passing centrally through the ELIT array.
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