发明公开
- 专利标题: METHOD FOR TRAINING A SYSTEM MODEL, SELECTING A CONTROLLER, SYSTEM, COMPUTER-SYSTEM
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申请号: EP23150926.6申请日: 2023-01-10
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公开(公告)号: EP4400975A1公开(公告)日: 2024-07-17
- 发明人: Tong, Son
- 申请人: Siemens Industry Software NV
- 申请人地址: BE 3001 Leuven Interleuvenlaan 68
- 专利权人: Siemens Industry Software NV
- 当前专利权人: Siemens Industry Software NV
- 当前专利权人地址: BE 3001 Leuven Interleuvenlaan 68
- 代理机构: Siemens Patent Attorneys
- 主分类号: G06F11/36
- IPC分类号: G06F11/36 ; G06F30/20 ; G05B13/04 ; B60W50/00
摘要:
The invention relates to a computer-implemented method for training a predefined system model (MDL) of a parametrized system (SYS), wherein scenarios (SCN) are a parameter set defining a system (SYS) state and/or system (SYS) operation, the method comprising:
(a) providing said system model (MDL),
(b) providing a first set (IST) of scenarios (SCN),
(c) selecting a sub-set (SST) of scenarios (SCN),
(d) acquiring system (SYS) test data (TDT) for the sub-set (SST) of scenarios (SCN),
(e) generating system model (MDL) data for the sub-set (SST) of scenarios (SCN),
(f) determining a modeling error (MER) of the system model (MDL) by comparing the test data (TDT) with the system model (MDL) data.
To reduce the model training complexity the method according to the invention proposes the additional steps:
(g) generating and/or training an error prediction model (EPM) on basis of the modeling errors (MER) determined,
(h) determining an error prediction (ERP) by the error prediction model (EPM) for the first set (IST) of scenarios (SCN),
(i) selecting a certain portion of the first set (IST) of scenarios (SCN) with the highest error prediction (ERP) determined by the error prediction model (EPM) as top error scenarios (TES),
(j) acquiring system (SYS) test data (TDT) for the selected top error scenarios (TES),
(k) training said system model (MDL) with the acquired system (SYS) test data (TDT) for the selected top error scenarios (TES).
(a) providing said system model (MDL),
(b) providing a first set (IST) of scenarios (SCN),
(c) selecting a sub-set (SST) of scenarios (SCN),
(d) acquiring system (SYS) test data (TDT) for the sub-set (SST) of scenarios (SCN),
(e) generating system model (MDL) data for the sub-set (SST) of scenarios (SCN),
(f) determining a modeling error (MER) of the system model (MDL) by comparing the test data (TDT) with the system model (MDL) data.
To reduce the model training complexity the method according to the invention proposes the additional steps:
(g) generating and/or training an error prediction model (EPM) on basis of the modeling errors (MER) determined,
(h) determining an error prediction (ERP) by the error prediction model (EPM) for the first set (IST) of scenarios (SCN),
(i) selecting a certain portion of the first set (IST) of scenarios (SCN) with the highest error prediction (ERP) determined by the error prediction model (EPM) as top error scenarios (TES),
(j) acquiring system (SYS) test data (TDT) for the selected top error scenarios (TES),
(k) training said system model (MDL) with the acquired system (SYS) test data (TDT) for the selected top error scenarios (TES).
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