- 专利标题: METHODS AND SYSTEMS FOR SENSING DEFORMATION
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申请号: EP24156153.9申请日: 2024-02-06
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公开(公告)号: EP4428484A1公开(公告)日: 2024-09-11
- 发明人: YANG, Fan , WANG, Jun , HU, Yu , WANG, Houyong , CHEN, Wu
- 申请人: Honeywell International Inc.
- 申请人地址: US Charlotte, NC 28202 855 S. Mint Street
- 专利权人: Honeywell International Inc.
- 当前专利权人: Honeywell International Inc.
- 当前专利权人地址: US Charlotte, NC 28202 855 S. Mint Street
- 代理机构: Haseltine Lake Kempner LLP
- 优先权: CN 2310225147 2023.03.09
- 主分类号: G01B5/30
- IPC分类号: G01B5/30 ; G01B7/16
摘要:
Methods, apparatuses and systems for a sensing deformation in a surface are disclosed herein. An example device may include a support unit including a first frame and a second frame. A first end of the first frame and a first end of the second frame are mechanically coupled to the surface. The sensing device includes a pin joint that mechanically couples the first frame to the second frame, such that a first relative movement between the first end of the first frame and the first end of the second frame is amplified to a second relative movement between a second end of the first frame and a second end of the second frame. The sensing device includes a sensor that senses the second relative movement between the second end of the first frame and the second end of the second frame.
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