The invention relates to a measurement device (10), in particular a vector network analyzer, for analyzing a device-under-test, DUT (20). The measurement device (10) comprises a signal generator (15) configured to generate a test signal; two or more test ports (11), wherein each of the two or more test ports (11) is adapted to be connected to the DUT (20), and to forward the test signal to the DUT (20) and/or to receive a response signal from the DUT (20); and two or more signal paths (21), wherein each of the two or more signal paths (21) is arranged to electrically connect the signal generator (15) to one of the test ports (11). At least one of the signal paths (21) comprises: a measurement unit (22) configured to measure RF signals; a reference coupler (23) configured to forward a decoupled portion of the test signal to the measurement unit (22); a first measurement coupler (24) configured to forward a first decoupled portion of the response signal to the measurement unit (22); and a second measurement coupler (25) configured to forward a second decoupled portion of the response signal to the measurement unit (22); wherein the second measurement coupler (25) is configured to adapt a characteristic of the second decoupled portion of the response signal such that the second decoupled portion differs from the first decoupled portion of the response signal.