- 专利标题: APPARATUS FOR SIMULTANEOUSLY ANALYZING MULTIPLE IONS WITH AN ELECTROSTATIC LINEAR ION TRAP
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申请号: EP24195623.4申请日: 2019-01-11
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公开(公告)号: EP4443473A2公开(公告)日: 2024-10-09
- 发明人: JARROLD, Martin F. , BOTAMANENKO, Daniel
- 申请人: The Trustees of Indiana University
- 申请人地址: US Bloomington, IN 47405 107 S. Indiana Avenue
- 专利权人: The Trustees of Indiana University
- 当前专利权人: The Trustees of Indiana University
- 当前专利权人地址: US Bloomington, IN 47405 107 S. Indiana Avenue
- 代理机构: Schott, Jakob Valentin
- 优先权: US 1862774703P 2018.12.03
- 分案原申请号: 19702777.4 2019.01.11
- 主分类号: H01J49/42
- IPC分类号: H01J49/42
摘要:
A charge detection mass spectrometer may include an ion source, an electrostatic linear ion trap (ELIT) including a charge detection cylinder disposed between a pair of coaxially aligned ion mirrors, means for selectively establishing electric fields within the ion mirrors configured to cause the trapped ions in the ELIT to oscillate back and forth between the ion mirrors each time passing through the charge detection cylinder, and means for controlling a trajectory of the beam of ions entering the ELIT to cause the subsequently trapped ions to oscillate with different planar ion oscillation trajectories angularly offset from one another about the longitudinal axis with each extending along and crossing the longitudinal axis in each of the ion mirrors or with different cylindrical ion oscillation trajectories radially offset from one another about the longitudinal axis to form nested cylindrical trajectories each extending along the longitudinal axis.
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