Invention Grant
- Patent Title: Metrology system for positioning assemblies
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Application No.: US14559034Application Date: 2014-12-03
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Publication No.: US10000298B2Publication Date: 2018-06-19
- Inventor: James M. Cobb , Clayton Lynn Munk , Dan Dresskell Day , Eric M. Reid , Matthew Ray DesJardien , Steven A. Best
- Applicant: The Boeing Company
- Applicant Address: US IL Chicago
- Assignee: The Boeing Company
- Current Assignee: The Boeing Company
- Current Assignee Address: US IL Chicago
- Agency: Yee & Associates, P.C.
- Main IPC: G06F19/00
- IPC: G06F19/00 ; B64F5/00 ; G05B19/19 ; G05B19/402 ; B64F5/10 ; B23Q1/03 ; B23Q1/62

Abstract:
A method and apparatus for maintaining a selected configuration for a structure during a manufacturing process for forming a product using the structure. Metrology data for a support system is received. The support system holds the structure during the manufacturing process. A determination is made as to whether a current configuration of the structure is within selected tolerances of the selected configuration for the structure based on the metrology data. The support system is reconfigured to move the structure into the selected configuration in response to a determination that the current configuration of the structure is not within the selected tolerances of the selected configuration for the structure.
Public/Granted literature
- US20150314891A1 Metrology System for Positioning Assemblies Public/Granted day:2015-11-05
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