Invention Grant
- Patent Title: Hardness test apparatus and hardness testing method
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Application No.: US15255753Application Date: 2016-09-02
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Publication No.: US10001432B2Publication Date: 2018-06-19
- Inventor: Eiji Furuta , Makoto Kaieda , Akira Takada
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2015-178034 20150910
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01N3/42

Abstract:
The present invention includes: an image capturer capturing an image of the sample to be measured; an image acquirer acquiring image data of the sample captured by the image capturer; a pattern searcher performing, on the image data of the sample acquired by the image acquirer, pattern searching process using a pattern image selected based on the sample and identifying a position in the image matching the pattern image; a profile extractor extracting a profile of the sample based on the position in the image identified by the pattern searcher; a calculator calculating a hardness measurement position of the sample based on the profile extracted by the profile extractor; and a measurer executing hardness testing on the sample based on the hardness measurement position calculated by the calculator and measuring the hardness of the sample.
Public/Granted literature
- US20170074764A1 HARDNESS TEST APPARATUS AND HARDNESS TESTING METHOD Public/Granted day:2017-03-16
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