- 专利标题: MEMS scan controlled keystone and distortion correction
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申请号: US14987010申请日: 2016-01-04
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公开(公告)号: US10009585B2公开(公告)日: 2018-06-26
- 发明人: Jari Honkanen , Robert James Jackson , P. Selvan Viswanathan , Jonathan A. Morarity , David W. Armour
- 申请人: Microvision, Inc.
- 申请人地址: US WA Redmond
- 专利权人: Microvision, Inc.
- 当前专利权人: Microvision, Inc.
- 当前专利权人地址: US WA Redmond
- 代理商 Kevin D. Wills
- 主分类号: G03B21/14
- IPC分类号: G03B21/14 ; H04N9/31
摘要:
Briefly, in accordance with one or more embodiments, a MEMS scanned beam projector includes a light source to emit a light beam, a scanning platform to redirect the light beam impinging on the platform, and a display controller to control the light source and the scanning platform to cause the scanning platform to scan the light beam in a vertical direction and a horizontal direction in a scan pattern to project an image onto a projection surface. The display controller is configured to correct for image distortion in the projected image by providing a compensated drive signal to the scanning platform to compensate for the image distortion.
公开/授权文献
- US20170195647A1 MEMS Scan Controlled Keystone and Distortion Correction 公开/授权日:2017-07-06
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