Invention Grant
- Patent Title: Magnetic resonance rapid parameter imaging method and system
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Application No.: US15103845Application Date: 2014-12-05
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Publication No.: US10018698B2Publication Date: 2018-07-10
- Inventor: Xi Peng , Dong Liang , Xin Liu , Hairong Zheng
- Applicant: SHENZHEN INSTITUTES OF ADVANCED TECHNOLOGY CHINESE ACADEMY OF SCIENCES
- Applicant Address: CN Shenzhen, Guangdong
- Assignee: Shenzhen Institutes Of Advanced Technology Chinese Academy Of Sciences
- Current Assignee: Shenzhen Institutes Of Advanced Technology Chinese Academy Of Sciences
- Current Assignee Address: CN Shenzhen, Guangdong
- Agency: Ladas & Parry, LLP
- Priority: CN201310671860 20131210
- International Application: PCT/CN2014/093168 WO 20141205
- International Announcement: WO2015/085889 WO 20150618
- Main IPC: G01V3/00
- IPC: G01V3/00 ; G01R33/561 ; G01R33/56 ; G01R33/50

Abstract:
Disclosed is a magnetic resonance rapid parameter imaging method and system. The method comprises: obtaining a target undersampled magnetic resonance signal (S10); obtaining prior information of a parameter model (S20); performing sequence reconstruction of a target image according to the undersampled magnetic resonance signal and the prior information to obtain a target image sequence (S30); and substituting the target image sequence into the parameter estimation model to obtain object parameters and to generate parametric images (S40).
Public/Granted literature
- US20160370444A1 MAGNETIC RESONANCE RAPID PARAMETER IMAGING METHOD AND SYSTEM Public/Granted day:2016-12-22
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