Invention Grant
- Patent Title: Charged particle beam device
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Application No.: US15417887Application Date: 2017-01-27
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Publication No.: US10020160B2Publication Date: 2018-07-10
- Inventor: Koichi Kuroda , Hajime Kawano , Makoto Suzuki , Yuzuru Mizuhara
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2016-015028 20160129
- Main IPC: G01N23/00
- IPC: G01N23/00 ; H01J37/00 ; H01J3/10 ; H01J37/147 ; H01J37/244 ; H01J37/28

Abstract:
An object of the present invention is to provide a charged particle beam device which can realize improved contrast of an elongated pattern in a specific direction, such as a groove-like pattern. In order to achieve the above-described object, the present invention proposes a charged particle beam device including a detector for detecting a charged particle obtained based on a charged particle beam discharged to a sample. The charged particle beam device includes a charged particle passage restricting member that has at least one of an arcuate groove and a groove having a longitudinal direction in a plurality of directions, and a deflector that deflects the charged particle discharged toward the groove from the sample. The charged particle discharged from the sample is deflected to a designated position of the groove.
Public/Granted literature
- US20170221672A1 Charged Particle Beam Device Public/Granted day:2017-08-03
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