Invention Grant
- Patent Title: Test element unit, array substrate, display panel, display apparatus, and method of manufacturing array substrate
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Application No.: US15527792Application Date: 2016-10-19
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Publication No.: US10020328B2Publication Date: 2018-07-10
- Inventor: Yu-Cheng Chan , Shuai Zhang , Qi Liu
- Applicant: BOE Technology Group Co., Ltd.
- Applicant Address: CN Beijing
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee Address: CN Beijing
- Agency: Westman, Champlin & Koehler, P.A.
- Priority: CN201510679983 20151019
- International Application: PCT/CN2016/102579 WO 20161019
- International Announcement: WO2017/067458 WO 20170427
- Main IPC: H01L23/58
- IPC: H01L23/58 ; H01L27/12 ; H01L21/66 ; H01L29/786

Abstract:
The present disclosure provides a test element unit, an array substrate, a display panel, a display apparatus and a corresponding manufacturing method. The test element unit includes: a plurality of layers of test patterns, each layer of test pattern including at least one test block and at least one capacitor being formed between test blocks located in different layers, and, two electrodes of each of capacitors being two test blocks located in different layers, respectively, so that it can determined whether or not corresponding components and devices formed in the display region meet requirements by detecting the test patterns formed in the test region.
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