Invention Grant
- Patent Title: Measurement and reporting of the latency of input and output operations by a solid state drive to a host
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Application No.: US14671663Application Date: 2015-03-27
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Publication No.: US10025535B2Publication Date: 2018-07-17
- Inventor: Robert E. Frickey, III , Ye Zhang
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: INTEL CORPORATION
- Current Assignee: INTEL CORPORATION
- Current Assignee Address: US CA Santa Clara
- Agency: Konrad Raynes Davda & Victor LLP
- Agent Rabindranath Dutta
- Main IPC: G06F13/00
- IPC: G06F13/00 ; G06F3/06
Abstract:
Provided are a method, apparatus, and a system for measuring latency of a storage device. The storage device measures one or more latencies of one or more input/output (I/O) operations received from a host. The storage device transmits information on the one or more latencies to the host.
Public/Granted literature
- US20160283119A1 MEASUREMENT AND REPORTING OF THE LATENCY OF INPUT AND OUTPUT OPERATIONS BY A SOLID STATE DRIVE TO A HOST Public/Granted day:2016-09-29
Information query
